特性
- High resolution SDD
- Element range : Mg - U (Na - U when using helium purge)
- Chamber design : closed
- XY stage options : motorized
- Largest sample : 270 x 220 x 150 mm
- Maximum number of collimators : 4
- Filters : 6 mode automatic switching
- Smallest collimator : 0.2mm
- X-ray Station & Mapping Station software
"Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.","Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range from 13Al to 92U on the periodic table.","EA6000VX"
技术参数
| 规格项 | 参数值 |
|---|---|
| 产品类别 | Elemental Analyzers |
| 样本类型 | Solid Samples |
| 分析测试介质/材料 | Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material |
| 分析方法/检测技术 | Vortex SDD X-Ray Detector |
| 分析元素 | Metal / Metalloid; Element Range : Mg - U (Na - U when using helium purge) |
